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Browsing byAuthorNakayama, Y
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Showing results 2 to 2 of 2
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2023-02-01
In-situ scanning transmission electron microscopy study of Al-amorphous SiO<inf>2</inf> layer-SiC interface
Adabifiroozjaei, E
;
Rastkerdar, E
;
Nemoto, Y
;
Nakayama, Y
;
Nishimiya, Y
;
Fronzi, M
;
Yao, Y
;
Nguyen, MT
;
Molina-Luna, L
;
Suzuki, TS