Browsing byAuthorRastkerdar, E
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Issue Date | Title | Author(s) |
2023-02-01 | In-situ scanning transmission electron microscopy study of Al-amorphous SiO<inf>2</inf> layer-SiC interface | Adabifiroozjaei, E; Rastkerdar, E; Nemoto, Y; Nakayama, Y; Nishimiya, Y; Fronzi, M; Yao, Y; Nguyen, MT; Molina-Luna, L; Suzuki, TS |