Determining the dislocation contrast factor for x-ray line profile analysis

Armstrong, NG Lynch, PA

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Publisher:: Springer Verlag
Publication Type:: Chapter
Citation:: Diffraction Analysis of the Microstructure of Materials, 2004, 1, pp. 249 - 286
Issue Date:: 2004-01

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Full metadata record

Field	Value	Language
dc.contributor.author	Armstrong, NG	en_US
dc.contributor.author	Lynch, PA	en_US
dc.contributor.editor	Mittemeijer, EJ	en_US
dc.contributor.editor	Scardi, P	en_US
dc.date.issued	2004-01	en_US
dc.identifier.citation	Diffraction Analysis of the Microstructure of Materials, 2004, 1, pp. 249 - 286	en_US
dc.identifier.isbn	3-540-40519-4	en_US
dc.identifier.uri	http://hdl.handle.net/10453/11650
dc.publisher	Springer Verlag	en_US
dc.relation.ispartof	Diffraction Analysis of the Microstructure of Materials	en_US
dc.title	Determining the dislocation contrast factor for x-ray line profile analysis	en_US
dc.type	Chapter
utslib.location	Berlin, Germany	en_US
utslib.for	0912 Materials Engineering	en_US
utslib.citation.edition	1	en_US
dc.location.activity	Snowbird, Utah, USA
pubs.embargo.period	Not known	en_US
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Science
utslib.copyright.status	closed_access
pubs.consider-herdc	true	en_US
pubs.edition	1	en_US
pubs.place-of-publication	Berlin, Germany	en_US

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