Effects of leakage inductances on magnetically coupled y-source network

Siwakoti, YP; Loh, PC; Blaabjerg, F; Town, GE

Effects of leakage inductances on magnetically coupled y-source network

Siwakoti, YP

Loh, PC Blaabjerg, F Town, GE

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Publication Type:: Journal Article
Citation:: IEEE Transactions on Power Electronics, 2014, 29 (11), pp. 5662 - 5666
Issue Date:: 2014-01-01

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Field	Value	Language
dc.contributor.author	Siwakoti, YP https://orcid.org/0000-0002-3869-412X	en_US
dc.contributor.author	Loh, PC	en_US
dc.contributor.author	Blaabjerg, F	en_US
dc.contributor.author	Town, GE	en_US
dc.date.issued	2014-01-01	en_US
dc.identifier.citation	IEEE Transactions on Power Electronics, 2014, 29 (11), pp. 5662 - 5666	en_US
dc.identifier.issn	0885-8993	en_US
dc.identifier.uri	http://hdl.handle.net/10453/118988
dc.description.abstract	Coupled inductors have been used with impedance-source networks, extended from the earlier Z-source network, to keep their shoot-through times short, while providing high-voltage gains. A commonly stated requirement for these networks is that their magnetic couplings must be strong or their leakage inductances must be small. This is often difficult to achieve in practice especially at high switching frequencies. It is therefore necessary to understand the effects that leakage inductances have on the performance of these converters. In this letter, we address these issues for the latest Y-source network, showing in particular that voltage spikes will appear across its switching devices in some, but not all, cases. Experimental results verifying the findings have been obtained and presented at the end of this letter. © 2014 IEEE.	en_US
dc.relation.ispartof	IEEE Transactions on Power Electronics	en_US
dc.relation.isbasedon	10.1109/TPEL.2014.2322856	en_US
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject.classification	Electrical & Electronic Engineering	en_US
dc.title	Effects of leakage inductances on magnetically coupled y-source network	en_US
dc.type	Journal Article
utslib.citation.volume	11	en_US
utslib.citation.volume	29	en_US
utslib.for	0906 Electrical and Electronic Engineering	en_US
pubs.embargo.period	Not known	en_US
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology/School of Electrical and Data Engineering
utslib.copyright.status	closed_access	*
pubs.issue	11	en_US
pubs.publication-status	Published	en_US
pubs.volume	29	en_US

Abstract:

Coupled inductors have been used with impedance-source networks, extended from the earlier Z-source network, to keep their shoot-through times short, while providing high-voltage gains. A commonly stated requirement for these networks is that their magnetic couplings must be strong or their leakage inductances must be small. This is often difficult to achieve in practice especially at high switching frequencies. It is therefore necessary to understand the effects that leakage inductances have on the performance of these converters. In this letter, we address these issues for the latest Y-source network, showing in particular that voltage spikes will appear across its switching devices in some, but not all, cases. Experimental results verifying the findings have been obtained and presented at the end of this letter. © 2014 IEEE.

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http://hdl.handle.net/10453/118988