Mirror enhanced STED super-resolution microscopy
- Publication Type:
- Conference Proceeding
- Citation:
- 2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings, 2017, 2017-January pp. 1 - 2
- Issue Date:
- 2017-10-25
Closed Access
Filename | Description | Size | |||
---|---|---|---|---|---|
08082925.pdf | Published version | 427.77 kB |
Copyright Clearance Process
- Recently Added
- In Progress
- Closed Access
This item is closed access and not available.
© 2017 IEEE. Through reflective interference, the axial thickness of confocal point spread function can be easily improved to 100 nm. Six-fold of axial resolution and two-fold of lateral resolution can be obtained for STED nanoscopy.
Please use this identifier to cite or link to this item: