Reconfigurable Nonisolated DC-DC Converter with Fault-Tolerant Capability

Soon, JL; Lu, DDC; Peng, JCH; Xiao, W

Reconfigurable Nonisolated DC-DC Converter with Fault-Tolerant Capability

Soon, JL Lu, DDC Peng, JCH Xiao, W

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Publisher:: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Publication Type:: Journal Article
Citation:: IEEE Transactions on Power Electronics, 2020, 35, (9), pp. 8934-8943
Issue Date:: 2020-09-01

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Field	Value	Language
dc.contributor.author	Soon, JL
dc.contributor.author	Lu, DDC
dc.contributor.author	Peng, JCH
dc.contributor.author	Xiao, W
dc.date.accessioned	2021-03-23T04:32:15Z
dc.date.available	2021-03-23T04:32:15Z
dc.date.issued	2020-09-01
dc.identifier.citation	IEEE Transactions on Power Electronics, 2020, 35, (9), pp. 8934-8943
dc.identifier.issn	0885-8993
dc.identifier.issn	1941-0107
dc.identifier.uri	http://hdl.handle.net/10453/147482
dc.description.abstract	© 1986-2012 IEEE. Malfunction of power semiconductor switches is the dominant cause of failure in power electronic converters. This article proposes a novel dual-switch dc-dc topology for high-reliability applications. The proposed converter is fault tolerant and supports operation under both step-down and step-up modes. The proposed topology can be reconfigured automatically under various switch-fault conditions in order to maintain normal operation. This is enabled by an affine-parametrization-based control design, which minimizes the transient impact of the faults. The reliability performance of the proposed converter is evaluated theoretically using a Markov model, demonstrating its superiority over conventional topologies. Finally, a laboratory prototype is developed and tested to verify the proposed design and control performance under switch faults.
dc.language	English
dc.publisher	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.relation.ispartof	IEEE Transactions on Power Electronics
dc.relation.isbasedon	10.1109/TPEL.2020.2971837
dc.rights	© 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.	en_US
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject	0906 Electrical and Electronic Engineering
dc.subject.classification	Electrical & Electronic Engineering
dc.title	Reconfigurable Nonisolated DC-DC Converter with Fault-Tolerant Capability
dc.type	Journal Article
utslib.citation.volume	35
utslib.for	0906 Electrical and Electronic Engineering
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology
pubs.organisational-group	/University of Technology Sydney/Faculty of Engineering and Information Technology/School of Electrical and Data Engineering
utslib.copyright.status	closed_access	*
pubs.consider-herdc	false
dc.date.updated	2021-03-23T04:32:12Z
pubs.issue	9
pubs.publication-status	Published
pubs.volume	35
utslib.citation.issue	9

Abstract:

© 1986-2012 IEEE. Malfunction of power semiconductor switches is the dominant cause of failure in power electronic converters. This article proposes a novel dual-switch dc-dc topology for high-reliability applications. The proposed converter is fault tolerant and supports operation under both step-down and step-up modes. The proposed topology can be reconfigured automatically under various switch-fault conditions in order to maintain normal operation. This is enabled by an affine-parametrization-based control design, which minimizes the transient impact of the faults. The reliability performance of the proposed converter is evaluated theoretically using a Markov model, demonstrating its superiority over conventional topologies. Finally, a laboratory prototype is developed and tested to verify the proposed design and control performance under switch faults.

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http://hdl.handle.net/10453/147482