Ultra-small cobalt particles embedded in titania by ion beam synthesis: Additional datasets including electron microscopy, neutron reflectometry, modelling outputs and particle size analysis.

Bake, A; Rahman, MR; Evans, PJ; Cortie, M; Nancarrow, M; Abrudan, R; Radu, F; Khaydukov, Y; Causer, G; Livesey, KL; Callori, S; Mitchell, DRG; Pastuovic, Z; Wang, X; Cortie, D

Ultra-small cobalt particles embedded in titania by ion beam synthesis: Additional datasets including electron microscopy, neutron reflectometry, modelling outputs and particle size analysis.

Bake, A Rahman, MR Evans, PJ Cortie, M

Nancarrow, M Abrudan, R Radu, F Khaydukov, Y Causer, G Livesey, KL Callori, S Mitchell, DRG Pastuovic, Z Wang, X Cortie, D

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Publisher:: Elsevier
Publication Type:: Journal Article
Citation:: Data in Brief, 2022, 40, pp. 1-12
Issue Date:: 2022-02-01

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Field	Value	Language
dc.contributor.author	Bake, A
dc.contributor.author	Rahman, MR
dc.contributor.author	Evans, PJ
dc.contributor.author	Cortie, M https://orcid.org/0000-0003-3202-6398
dc.contributor.author	Nancarrow, M
dc.contributor.author	Abrudan, R
dc.contributor.author	Radu, F
dc.contributor.author	Khaydukov, Y
dc.contributor.author	Causer, G
dc.contributor.author	Livesey, KL
dc.contributor.author	Callori, S
dc.contributor.author	Mitchell, DRG
dc.contributor.author	Pastuovic, Z
dc.contributor.author	Wang, X
dc.contributor.author	Cortie, D
dc.date.accessioned	2022-12-13T03:10:35Z
dc.date.available	2021-11-30
dc.date.available	2022-12-13T03:10:35Z
dc.date.issued	2022-02-01
dc.identifier.citation	Data in Brief, 2022, 40, pp. 1-12
dc.identifier.issn	2352-3409
dc.identifier.issn	2352-3409
dc.identifier.uri	http://hdl.handle.net/10453/164347
dc.description.abstract	This Data-in-brief article includes datasets of electron microscopy, polarised neutron reflectometry and magnetometry for ultra-small cobalt particles formed in titania thin films via ion beam synthesis. Raw data for polarised neutron reflectometry, magnetometry and the particle size distribution are included and made available on a public repository. Additional elemental maps from scanning electron microscopy (SEM) with energy dispersive spectroscopy (EDS) are also presented. Data were obtained using the following types of equipment: the NREX and PLATYPUS polarised neutron reflectometers; a Quantum Design Physical Property Measurement System (14 T); a JEOL JSM-6490LV SEM, and a JEOL ARM-200F scanning transmission electron microscope (STEM). The data is provided as supporting evidence for the article in Applied Surface Science (A. Bake et al., Appl. Surf. Sci., vol. 570, p. 151068, 2021, DOI 10.1016/j.apsusc.2021.151068), where a full discussion is given. The additional supplementary reflectometry and modelling datasets are intended to assist future scientific software development of advanced fitting algorithms for magnetization gradients in thin films.
dc.format	Electronic-eCollection
dc.language	eng
dc.publisher	Elsevier
dc.relation.ispartof	Data in Brief
dc.relation.isbasedon	10.1016/j.dib.2021.107674
dc.rights	info:eu-repo/semantics/openAccess
dc.title	Ultra-small cobalt particles embedded in titania by ion beam synthesis: Additional datasets including electron microscopy, neutron reflectometry, modelling outputs and particle size analysis.
dc.type	Journal Article
utslib.citation.volume	40
utslib.location.activity	Netherlands
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Science
pubs.organisational-group	/University of Technology Sydney/Faculty of Science/School of Mathematical and Physical Sciences
utslib.copyright.status	open_access	*
pubs.consider-herdc	false
dc.date.updated	2022-12-13T03:10:26Z
pubs.publication-status	Published
pubs.volume	40

Abstract:

This Data-in-brief article includes datasets of electron microscopy, polarised neutron reflectometry and magnetometry for ultra-small cobalt particles formed in titania thin films via ion beam synthesis. Raw data for polarised neutron reflectometry, magnetometry and the particle size distribution are included and made available on a public repository. Additional elemental maps from scanning electron microscopy (SEM) with energy dispersive spectroscopy (EDS) are also presented. Data were obtained using the following types of equipment: the NREX and PLATYPUS polarised neutron reflectometers; a Quantum Design Physical Property Measurement System (14 T); a JEOL JSM-6490LV SEM, and a JEOL ARM-200F scanning transmission electron microscope (STEM). The data is provided as supporting evidence for the article in Applied Surface Science (A. Bake et al., Appl. Surf. Sci., vol. 570, p. 151068, 2021, DOI 10.1016/j.apsusc.2021.151068), where a full discussion is given. The additional supplementary reflectometry and modelling datasets are intended to assist future scientific software development of advanced fitting algorithms for magnetization gradients in thin films.

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http://hdl.handle.net/10453/164347