Investigation of saturation and excitation behavior of 1.5 μm emission from Er<sup>3+</sup> ions in SiO<inf>2</inf> sensitized with Si nanocrystals

Timmerman, D; Saeed, S; Gregorkiewicz, T; Roldán Gutiérrez, MA; Molina, SI

Investigation of saturation and excitation behavior of 1.5 μm emission from Er<sup>3+</sup> ions in SiO<inf>2</inf> sensitized with Si nanocrystals

Timmerman, D Saeed, S Gregorkiewicz, T Roldán Gutiérrez, MA Molina, SI

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Publication Type:: Journal Article
Citation:: Physica Status Solidi (C) Current Topics in Solid State Physics, 2012, 9 (12), pp. 2312 - 2317
Issue Date:: 2012-12-01

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Field	Value	Language
dc.contributor.author	Timmerman, D	en_US
dc.contributor.author	Saeed, S	en_US
dc.contributor.author	Gregorkiewicz, T	en_US
dc.contributor.author	Roldán Gutiérrez, MA	en_US
dc.contributor.author	Molina, SI	en_US
dc.date.issued	2012-12-01	en_US
dc.identifier.citation	Physica Status Solidi (C) Current Topics in Solid State Physics, 2012, 9 (12), pp. 2312 - 2317	en_US
dc.identifier.issn	1862-6351	en_US
dc.identifier.uri	http://hdl.handle.net/10453/34499
dc.description.abstract	Using time-resolved photoluminescence spectroscopy we investigated the 1.5 μm emission from Er3+ ions embedded in SiO2 matrix sensitized with Si nanocrystals. Temporal characteristics are analyzed as the function of excitation powers and temperatures. We confirm the predominance of two excitation channels - a fast one, with nanosecond dynamics, and a slow one, taking place on the microsecond time scale. Upon increasing excitation power, the fast mechanism saturates and further increase of total photoluminescence intensity is facilitated by the slow energy transfer process. Consequences of this finding on the microscopic modeling of the excitation process are discussed. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.	en_US
dc.relation.ispartof	Physica Status Solidi (C) Current Topics in Solid State Physics	en_US
dc.relation.isbasedon	10.1002/pssc.201200311	en_US
dc.title	Investigation of saturation and excitation behavior of 1.5 μm emission from Er<sup>3+</sup> ions in SiO<inf>2</inf> sensitized with Si nanocrystals	en_US
dc.type	Journal Article
utslib.citation.volume	12	en_US
utslib.citation.volume	9	en_US
utslib.for	0912 Materials Engineering	en_US
utslib.for	0204 Condensed Matter Physics	en_US
utslib.for	0206 Quantum Physics	en_US
pubs.embargo.period	Not known	en_US
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Science
pubs.organisational-group	/University of Technology Sydney/Faculty of Science/School of Mathematical and Physical Sciences
utslib.copyright.status	closed_access
pubs.issue	12	en_US
pubs.publication-status	Published	en_US
pubs.volume	9	en_US

Abstract:

Using time-resolved photoluminescence spectroscopy we investigated the 1.5 μm emission from Er3+ ions embedded in SiO2 matrix sensitized with Si nanocrystals. Temporal characteristics are analyzed as the function of excitation powers and temperatures. We confirm the predominance of two excitation channels - a fast one, with nanosecond dynamics, and a slow one, taking place on the microsecond time scale. Upon increasing excitation power, the fast mechanism saturates and further increase of total photoluminescence intensity is facilitated by the slow energy transfer process. Consequences of this finding on the microscopic modeling of the excitation process are discussed. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

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http://hdl.handle.net/10453/34499