Decomposition of wavelength dispersive x-ray spectra

Rémond, G; Myklebust, R; Fialin, M; Nockolds, C; Phillips, M; Roques-Carmes, C

Decomposition of wavelength dispersive x-ray spectra

Rémond, G Myklebust, R Fialin, M Nockolds, C Phillips, M

Roques-Carmes, C

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Publication Type:: Journal Article
Citation:: Journal of Research of the National Institute of Standards and Technology, 2002, 107 (6), pp. 509 - 529
Issue Date:: 2002-01-01

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Field	Value	Language
dc.contributor.author	Rémond, G	en_US
dc.contributor.author	Myklebust, R	en_US
dc.contributor.author	Fialin, M	en_US
dc.contributor.author	Nockolds, C	en_US
dc.contributor.author	Phillips, M https://orcid.org/0000-0003-1522-9281	en_US
dc.contributor.author	Roques-Carmes, C	en_US
dc.date.available	2002-08-22	en_US
dc.date.issued	2002-01-01	en_US
dc.identifier.citation	Journal of Research of the National Institute of Standards and Technology, 2002, 107 (6), pp. 509 - 529	en_US
dc.identifier.issn	1044-677X	en_US
dc.identifier.uri	http://hdl.handle.net/10453/5863
dc.description.abstract	Line shapes of atomic lines and soft x-ray emission bands measured with a wavelength dispersive spectrometer (WDS) with the Electron Probe Micro Analyzer (EPMA) are reviewed. Least square fitting to pseudo-Voigt profiles of the digitally measured spectra are used to account for the presence of non-diagram features (high and low energy satellites) and instrumental induced distortions. The effect of line width and relative intensities on the quality of fits is illustrated. Spectral distortions resulting from the presence of absorption edges within the analyzed wavelength region are illustrated for the case of FeLα,β emission bands for pure Fe and iron oxides. For quantitative analysis, an analytical approach is presented where the measured soft x-ray emission bands are corrected for self absorption before extracting the intensities from the experimental data.	en_US
dc.relation.ispartof	Journal of Research of the National Institute of Standards and Technology	en_US
dc.relation.isbasedon	10.6028/jres.107.044	en_US
dc.subject.classification	General Science & Technology	en_US
dc.title	Decomposition of wavelength dispersive x-ray spectra	en_US
dc.type	Journal Article
utslib.citation.volume	6	en_US
utslib.citation.volume	107	en_US
utslib.for	0912 Materials Engineering	en_US
utslib.for	0204 Condensed Matter Physics	en_US
pubs.embargo.period	Not known	en_US
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Science
pubs.organisational-group	/University of Technology Sydney/Faculty of Science/School of Mathematical and Physical Sciences
pubs.organisational-group	/University of Technology Sydney/Strength - CCET - Centre for Clean Energy Technology
utslib.copyright.status	open_access
pubs.issue	6	en_US
pubs.publication-status	Published	en_US
pubs.volume	107	en_US

Abstract:

Line shapes of atomic lines and soft x-ray emission bands measured with a wavelength dispersive spectrometer (WDS) with the Electron Probe Micro Analyzer (EPMA) are reviewed. Least square fitting to pseudo-Voigt profiles of the digitally measured spectra are used to account for the presence of non-diagram features (high and low energy satellites) and instrumental induced distortions. The effect of line width and relative intensities on the quality of fits is illustrated. Spectral distortions resulting from the presence of absorption edges within the analyzed wavelength region are illustrated for the case of FeLα,β emission bands for pure Fe and iron oxides. For quantitative analysis, an analytical approach is presented where the measured soft x-ray emission bands are corrected for self absorption before extracting the intensities from the experimental data.

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http://hdl.handle.net/10453/5863