Planar Waveguide Echelle Gratings in Silica-On-Silicon

Janz, S; Balakrishnan, A; Charbonneau, S; Cheben, P; Cloutier, M; Delâge, A; Dossou, K; Erickson, L; Gao, M; Krug, PA; Lamontagne, B; Packirisamy, M; Pearson, M; Xu, DX

Planar Waveguide Echelle Gratings in Silica-On-Silicon

Janz, S Balakrishnan, A Charbonneau, S Cheben, P Cloutier, M Delâge, A Dossou, K

Erickson, L Gao, M Krug, PA Lamontagne, B Packirisamy, M Pearson, M Xu, DX

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Publication Type:: Journal Article
Citation:: IEEE Photonics Technology Letters, 2004, 16 (2), pp. 503 - 505
Issue Date:: 2004-02-01

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Field	Value	Language
dc.contributor.author	Janz, S	en_US
dc.contributor.author	Balakrishnan, A	en_US
dc.contributor.author	Charbonneau, S	en_US
dc.contributor.author	Cheben, P	en_US
dc.contributor.author	Cloutier, M	en_US
dc.contributor.author	Delâge, A	en_US
dc.contributor.author	Dossou, K https://orcid.org/0000-0002-2342-8945	en_US
dc.contributor.author	Erickson, L	en_US
dc.contributor.author	Gao, M	en_US
dc.contributor.author	Krug, PA	en_US
dc.contributor.author	Lamontagne, B	en_US
dc.contributor.author	Packirisamy, M	en_US
dc.contributor.author	Pearson, M	en_US
dc.contributor.author	Xu, DX	en_US
dc.date.issued	2004-02-01	en_US
dc.identifier.citation	IEEE Photonics Technology Letters, 2004, 16 (2), pp. 503 - 505	en_US
dc.identifier.issn	1041-1135	en_US
dc.identifier.uri	http://hdl.handle.net/10453/713
dc.description.abstract	Silica planar waveguide echelle grating demultiplexers with 48 channels and 256 channels are described and demonstrated. Polarization effects due to stress birefringence and polarization-dependent grating efficiency have been eliminated using a modified polarization compensator and grating design. The devices have a polarization-dependent wavelength shift of less than 10 pm, and a polarization-dependent loss below 0.2 dB. The 48-channel device has a measured crosstalk of -35 dB, an insertion loss better than 4 dB, and a uniformity of 1 dB across the C-band.	en_US
dc.relation.ispartof	IEEE Photonics Technology Letters	en_US
dc.relation.isbasedon	10.1109/LPT.2003.823139	en_US
dc.subject.classification	Optoelectronics & Photonics	en_US
dc.title	Planar Waveguide Echelle Gratings in Silica-On-Silicon	en_US
dc.type	Journal Article
utslib.citation.volume	2	en_US
utslib.citation.volume	16	en_US
utslib.for	0205 Optical Physics	en_US
utslib.for	0906 Electrical and Electronic Engineering	en_US
pubs.embargo.period	Not known	en_US
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Science
pubs.organisational-group	/University of Technology Sydney/Faculty of Science/School of Mathematical and Physical Sciences
utslib.copyright.status	closed_access
pubs.issue	2	en_US
pubs.publication-status	Published	en_US
pubs.volume	16	en_US

Abstract:

Silica planar waveguide echelle grating demultiplexers with 48 channels and 256 channels are described and demonstrated. Polarization effects due to stress birefringence and polarization-dependent grating efficiency have been eliminated using a modified polarization compensator and grating design. The devices have a polarization-dependent wavelength shift of less than 10 pm, and a polarization-dependent loss below 0.2 dB. The 48-channel device has a measured crosstalk of -35 dB, an insertion loss better than 4 dB, and a uniformity of 1 dB across the C-band.

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http://hdl.handle.net/10453/713